Автор: Mario Birkholz

. Thin Film Analysis by X-Ray Scattering

Thin Film Analysis by X-Ray Scattering

Mario Birkholz

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the...

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