Автор: Liu Yong

. Modeling and Simulation for Microelectronic Packaging Assembly. Manufacturing, Reliability and Testing

Modeling and Simulation for Microelectronic Packaging Assembly. Manufacturing, Reliability and Testing

Liu Yong

Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming «test and try out» method to obtain the best solution....

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