Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications
Friedbacher Gernot
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts – electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) «… a useful resource…» (Journal of the American Chemical Society)
- Категория: зарубежная образовательная литература
- Правообладатель: John Wiley & Sons Limited
- Возрастное ограничение: 0+
- ISBN: 9783527636945
- Легальная стоимость: 24584.68 руб.
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